secondary-electron spectroscopy

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• Auger electron spectroscopy — (AES; Auger pronounced|oːʒeː in French) is a common analytical technique used specifically in the study of surfaces and, more generally, in the area of materials science. Underlying the spectroscopic technique is the Auger effect, as it has come… …   Wikipedia

• spectroscopy — spectroscopist /spek tros keuh pist/, n. /spek tros keuh pee, spek treuh skoh pee/, n. the science that deals with the use of the spectroscope and with spectrum analysis. [1865 70; SPECTRO + SCOPY] * * * Branch of analysis devoted to identifying… …   Universalium

• Electron microscope — Diagram of a transmission electron microscope A 197 …   Wikipedia

• Electron microprobe — An electron microprobe (EMP), also known as an electron probe microanalyser (EPMA) is an analytical tool used to non destructively determine the chemical composition of small volumes of solid materials. It works similarly to a scanning electron… …   Wikipedia

• Electron Beam Ion Source — Eine Electron Beam Ion Trap (EBIT, Elektronenstrahl Ionenfalle) ist eine spezielle Art von Ionenfalle. Dieser Typ Falle eignet sich insbesondere für die Erzeugung und Speicherung hochgeladener Ionen. In ihr werden niedriggeladene Ionen… …   Deutsch Wikipedia

• Electron Beam Ion Trap — Eine Electron Beam Ion Trap (EBIT) bzw. Elektronenstrahl Ionenfalle ist eine spezielle Art von Ionenfalle. Dieser Typ Falle eignet sich insbesondere für die Erzeugung und Speicherung hochgeladener Ionen. In ihr werden niedriggeladene Ionen… …   Deutsch Wikipedia

• Scanning electron microscope — These pollen grains taken on an SEM show the characteristic depth of field of SEM micrographs …   Wikipedia

• Static secondary ion mass spectrometry — Static secondary ion mass spectrometry, or static SIMS is a technique for chemical analysis including elemental composition and chemical structure of the uppermost atomic or molecular layer of a solid which may be a metal, semiconductor or… …   Wikipedia

• Field electron emission — It is requested that a diagram or diagrams be included in this article to improve its quality. For more information, refer to discussion on this page and/or the listing at Wikipedia:Requested images. Field emission (FE) (also known as field… …   Wikipedia

• Core electron — Core electrons are the electrons in an atom that are not valence electrons and therefore do not participate in bonding. An example: the carbon atom has a total of 6 electrons, 4 of them being valence electrons. So the remaining 2 electrons must… …   Wikipedia

• Photoemission electron microscopy — (PEEM, also called photoelectron microscopy, PEM) is a widely used type of emission microscopy. PEEM utilizes local variations in electron emission to generate image contrast. The excitation is usually produced by UV light, synchrotron radiation… …   Wikipedia